mcf.gatech.edu
X-Ray Diffraction (XRD)
http://mcf.gatech.edu/capabilities/x-ray-diffraction
GT - IEN/IMAT Materials Characterization Facility. Shared User Mngmt. System (SUMS). Scanning Electron Microscopy (SEM). Transmission Electron Microscopy (TEM). SPM & Optical Techniques. Zeiss Ultra 60 SEM. FEI Nova Nanolab 200 FIB/SEM. FEI Tecnai G2 F30 TEM. Veeco Dimension 3100 AFM. Thermo Almega Confocal Raman Microscope. Kratos Axis Ultra XPS/UPS. GT - IEN/IMAT Materials Characterization Facility. And houses three state-of-the-art PANalytical X-Pert Pro X-Ray Diffractometers (XRD’s). XRD. Optics syst...
cncf.nanoscience.gatech.edu
SELECTED RESULTS | Center for Nanostructure Characterization
http://cncf.nanoscience.gatech.edu/node/105
2010 Georgia Institute of Technology School of Materials Science and Engineering. JEOL 100CX II TEM. SEM images of Au nanoparticles - -Hitachi SU8010. SEM images of ZnO nanowire arrays - - LEO1530. CeO2 octahedron - - JEOL 4000EX. HRTEM image of a small ZnO nanoparticle - - JEOL 4000EX. HRTEM images of Au-Pd core-shell nanoparticles - -JEOL 4000EX. A set of selected-area electron diffraction (SAED) patterns from epsilon-Fe2O3 nanowires - -JEOL 4000EX. EDX mapping in STEM mode - - FEI Tecnai F30. Readers ...
cncf.nanoscience.gatech.edu
F30 | Center for Nanostructure Characterization
http://cncf.nanoscience.gatech.edu/TEM/F30
2010 Georgia Institute of Technology School of Materials Science and Engineering. JEOL 100CX II TEM. FEI Tecnai F30 TEM operation instruction. Sign in the logbook. Fill up the Dewar flask with liquid nitrogen and place it as shown during microscope training. If the Cold Trap was at room temperature, you may need to allow it to cool for at least 30 minutes. Re-fill liquid nitrogen during the session if needed. 4 INCA, if you want to do EDS;. 5 TEM images and analysis (TIA). Gun IGP3 - - - 1. Load the spec...
cncf.nanoscience.gatech.edu
WEB LINKS | Center for Nanostructure Characterization
http://cncf.nanoscience.gatech.edu/node/5
2010 Georgia Institute of Technology School of Materials Science and Engineering. JEOL 100CX II TEM. Georgia Tech Institute for Materials. Materials Science and Engineering. Theme designed by Donny Carette.
cncf.nanoscience.gatech.edu
Billing Rates | Center for Nanostructure Characterization
http://cncf.nanoscience.gatech.edu/node/107
2010 Georgia Institute of Technology School of Materials Science and Engineering. JEOL 100CX II TEM. Effective March 1, 2016. CNC is now part of the shared use Materials Characterization Facility (MCF). Users are charged hourly for the following instruments:. JEOL 100 CX-II TEM. Tecnai F30 high resolution TEM. Will be $80/hr for the first 25 hours, $40/hr for all additional hours in that quarter. Academic rate is for Georgia Tech and other academic institutions, and. For the latter,.
cncf.nanoscience.gatech.edu
LEO 1530 Thermally-Assisted Field Emission (TFE) Scanning Electron Microscope (SEM) | Center for Nanostructure Characterization
http://cncf.nanoscience.gatech.edu/SEM/LEO1530
2010 Georgia Institute of Technology School of Materials Science and Engineering. JEOL 100CX II TEM. LEO 1530 Thermally-Assisted Field Emission (TFE) Scanning Electron Microscope (SEM). Check that Green on button on the front panel of the instrument is lit up. If not, turn on green button on the front panel, and the PC next to the benchtop. Log into SUMS. using the computer to the right The SEM monitor will power up. Double click on the SmartSEM Interface Icon on the desktop. Close door and hold shut.
cncf.nanoscience.gatech.edu
SERVICE UPDATE | Center for Nanostructure Characterization
http://cncf.nanoscience.gatech.edu/SERVICE%20UPDATE
2010 Georgia Institute of Technology School of Materials Science and Engineering. For more information, please contact. Yolande Berta, Sr. Research Scientist. JEOL 100CX II TEM. The following is a list of CNC equipment and their current working statuses:. Working; some issues with cooling water. Working; operate at 150 kV. Quorum Q-150T Sputter coater:. Theme designed by Donny Carette.
cncf.nanoscience.gatech.edu
Hitachi HF-2000 Field Emission Gun (FEG) Transmission Electron Microscope (TEM) 200kV | Center for Nanostructure Characterization
http://cncf.nanoscience.gatech.edu/TEM/HF2000
2010 Georgia Institute of Technology School of Materials Science and Engineering. JEOL 100CX II TEM. Hitachi HF-2000 Field Emission Gun (FEG) Transmission Electron Microscope (TEM) 200kV. Start Up, Alignment and Shut Down. Check that all the lights on the vacuum panel are green. In addition, IP1. On the left side of the gauge, IP2. Should be in the black region. Of the scale, and IP3. Should be in the middle of the scale. If the vacuum gauges show anything other than these positions. Pulling straight out...
